Gel-Pak to Present at European IS-Test Workshop 2025 in Munich

Hayward, CA — September 8, 2025 — Gel-Pak, a division of Delphon and a leader in advanced device handling solutions, is proud to announce its participation in the European IS-Test Workshop (ITWS) 2025, part of the prestigious International Test Workshop Series hosted by HTT Group.

The event will take place September 15-16, 2025, at the Marriott Airport Hotel Freising in Munich, bringing together global experts in semiconductor test innovation.

As part of the workshop, Gel-Pak will deliver a joint presentation with Celadon Systems, Inc. titled:

“Extending Parametric Probecard Lifetime to Reduce Overall Cost of Test for Very Small Pad Probing”

The talk will be co-presented by Dr. Victoria Tran, Senior Director of R&D at Delphon (Gel-Pak), and Garrett Tranquillo, Senior Technical Sales and Applications Engineer at Celadon Systems, Inc., highlighting collaborative advancements in probe card technology that drive cost efficiency and performance in semiconductor testing.

“We’re thrilled to join ITWS 2025 and share our latest innovations with the international test community,” said Dr. Victoria Tran. “This workshop is an ideal platform to showcase how Gel-Pak’s solutions are helping extend the life of parametric probecards while reducing the overall cost of test.”

For more information about Gel-Pak and its participation at ITWS 2025, visit http://www.gelpak.com.